PENANG, MALAYSIA (September 2026) – Silicon photonic devices are fundamentally different from traditional semiconductor components. By combining optical and electrical functions within increasingly complex architectures, they introduce new challenges in wafer-level characterization and production testing. To support the growing demands of photonic device characterisation and production test, Pentamaster is proud to introduce Lumon-D, a Silicon Photonic Double-Sided
To support the growing demands of photonic device characterisation and production test, Pentamaster is proud to introduce Lumon-D, a Silicon Photonic Double-Sided Wafer Prober designed to enable simultaneous access to both sides of the wafer.
A New Approach to Wafer-Level Photonics Test
Lumon-D is designed around an important principle: complete test with complete access. Unlike conventional wafer probing approaches, Lumon-D enables simultaneous top-side and bottom-side wafer access that allows accurate device characterization across multiple validation scenarios.
One Platform. Multiple Test Configurations.
Designed to support diverse test requirements, Lumon-D accommodates multiple optical and electrical test configurations, including:
- Electrical-to-Optical (E/O)
- Optical-to-Electrical (O/E)
- Optical-to-Optical (O/O)
- Electrical-to-Electrical (E/E)
Built for Stable and Reliable Measurements
Lumon-D incorporates a stable, low-loss optical measurement environment to minimize signal loss and maintain measurement consistency throughout the testing process. With this stable testing environment, Lumon-D provides highly repeatable and dependable results.
The continued evolution of silicon photonics is driving new requirements for testing and manufacturing, Lumon-D is developed to meet these requirements. With Lumon-D, Pentamaster strengthens the Group’s commitment to supporting the silicon photonics industry through purpose-built solutions that address the challenges.
Lumon-D at a Glance:
- Simultaneous probing from both sides of the wafer
- Supports E/O, O/E, O/O, and E/E test configurations
- Sub-micron optical alignment for precise and repeatable fiber coupling
- Stable, low-loss optical measurement environment
- High-precision automated wafer handling