Penang, Malaysia (April 2025) – Pentamaster, a leading provider of semiconductor test systems, is proud to introduce PM52X-KGD, an innovative test system designed to optimize die-level test yields for wide-bandgap devices, which are critical components in power semiconductors.
Known Good Die (KGD) testing plays a vital role in semiconductor manufacturing, particularly for power devices like Silicon Carbide (SiC). By thoroughly testing each die before packaging, manufacturers can detect and discard defective units early, helping to ensure high product reliability and performance.
As the adaptation of electric vehicles (EV) continues to rise rapidly, the demand for power semiconductors that adhere to strict standards & requirements increases drastically. Our test system helps manufacturers ensure that every individual die undergoes thorough testing to meet stringent performance and reliability standards before being integrated into packages for real-life applications.
PM52X-KGD is designed to meet the growing demands of the market with its fully integrated solution for testing bare dies in wafer form. The system features fully automated handling, precise electrical parametric testing under room to hot temperature as well as cutting-edge vision inspection technology. Its hybrid architecture delivers exceptional output efficiency, achieving 1500~2000 sprint UPH for high-throughput performance. Supporting multiple testers with the flexibility to operate with either probe cards or sockets, PM52X-KGD provides a versatile platform for comprehensive static and dynamic electrical parametric testing. Our handler integrates seamlessly with any power tester on the market, adapting to diverse requirements and needs.
Our KGD testing process covers a broad spectrum of checks designed to identify and remove defects which includes AC Test, DC Test and UIS Test.
Get in touch with us today to know more about PM52X-KGD.