Penang, Malaysia (July 2024) – Pentamaster, a leading global provider of semiconductor test and burn-in solutions, is thrilled to announce the launch of our Trooper-BI series. This series supports configurations ranging from single to multiple thermal chucks and is specifically designed for silicon carbide (SiC) applications.
The Trooper-BI series offers a comprehensive, fully automated solution for wafer-level silicon carbide burn-in, accommodating a range of customizations and designs to support mass production testing. Our solutions enable parallel burn-in with single to multiple chucks, utilizing a precision active alignment gantry system to automate wafer handling from cassettes to chucks. The system supports 6” to 8” wafers and multiple probe tests, with thermal chuck temperatures reaching up to 200°C.
We are delighted to introduce our latest models: the Trooper-BI6 and Trooper-BI8-G, which facilitate the parallel burn-in of 6 to 8 wafers, delivering high throughput.
Trooper-BI6 Hexa-Chuck Wafer-Level Burn-in System
- Fully Automated system with no human interventions
- Efficient wafer handling time <3s, for short burn in time with high throughput
- 6 wafers parallel burn-in
- Up to 200°C wafer chuck temperature
- HTRB stress up to 3,500V
- HTRB and HTGB 2in1 probe card
- Pre and Post burn-in test with Vth measurement
- Online IDSS and IGSS monitoring during burn in
- Accurate leakage measurement down to <5nA
- Individual die burn-in circuit protection
- Probe mark inspection
Trooper-BI8-G Octa-Chuck Wafer-Level Burn-in System
- Fully automated system with no human intervention
- Efficient wafer handling time <3s, for short burn in time with high throughput
- 8 wafers parallel burn-in
- Up to 200°C wafer chuck temperature
- HTGB up to 6,000 die parallel burn in
- Pre and post Burn-in with Vth measurement
- Accurate leakage measurement down to <5nA
- Online IGSS monitoring during burn in
- Individual die burn-in circuit protection
- Probe mark inspection
Interested to know more? Get in touch with us today for more information.